Patent Number: 6,166,813

Title: Retroreflectometer and method for measuring retroreflectivity of materials

Abstract: A system and method for measuring the retroreflectivity of materials. The system comprises a light source and a first optical pathway along which an illumination light beam travels originating from the light source and ending at a retroreflective surface to be measured. Also, a second optical pathway is provided along which a retroreflected beam travels back from the retroreflective surface to a sensor array. A processor is electrically coupled to the sensor array with an accompanying memory on which is stored operating logic adapted to determine the intensity of a predetermined pattern of the retroreflected beam incident to the sensor array which defines the retroreflected light which propagates from the retroreflective surface at a predetermined observation angle.

Inventors: Roberts; David Wayne (Atlanta, GA)

Assignee: Georgia Tech Research Corporation

International Classification: G01N 21/55 (20060101); G01N 021/47 ()

Expiration Date: 12/26/2017