Patent Number: 6,166,845

Title: Electro-optic probe

Abstract: The present invention relates to a probe for an electro-optic sampling oscillator. The probe for an electro-optic sampling oscillator provides a laser diode that generates a laser beam based on the control signal of the electro-optical sampling oscilloscope; a collimator lens that makes the laser beam into a parallel beam; an electro-optic element that has a reflecting film at the end; an isolator provided between the collimator lens and the electro-optic element that passes the laser beam that is generated by the laser diode and separates the reflected beam of the laser beam that was reflected by the reflecting film; photodiodes that convert the reflected beam separated by the isolator into an electrical signal; and a condenser lens provided between the isolator and the electro-optic element that condenses the parallel beam to one point on the reflecting film, makes the reflected beam reflected by the reflecting film into a parallel beam again, and makes the optical axes of the light incident on the reflecting film and the light reflected by the reflecting film coincide.

Inventors: Ito; Akishige (Tokyo, JP), Ohta; Katsushi (Tokyo, JP), Yagi; Toshiyuki (Tokyo, JP), Shinagawa; Mitsuru (Tokyo, JP), Nagatsuma; Tadao (Tokyo, JP), Yamada; Junzo (Tokyo, JP)

Assignee: Ando Electric Co., Ltd.

International Classification: G01R 1/067 (20060101); G01R 1/07 (20060101); G01R 13/34 (20060101); G01R 13/22 (20060101); G02F 001/03 ()

Expiration Date: 12/26/2017