Patent Number: 6,253,341

Title: IC test system

Abstract: An IC testing system is provided with comparator circuits for comparing at two types of voltage levels, with respect to an output signal of a device to be measured, a memory for storing the state of window strobe of each test cycle, based on test control signals for strobe decisions, control signal generating circuits for generating control signals related to the generation of window strobes, based on the state stored in the aforementioned memory, and a signal decision circuit generating strobe signals which have been timing-corrected, in response to the voltage levels for window strobe decisions for producing window strobes, based on the control signals from the aforementioned control signal generating circuit and the aforementioned test control signals, and window strobes for performing window strobe decisions with respect to signals from the aforementioned comparator circuits.

Inventors: Sugizaki; Takayuki (Tokyo, JP)

Assignee: Ando Electric Co., Ltd.

International Classification: G01R 31/28 (20060101); G01R 31/3193 (20060101); G11C 029/00 ()

Expiration Date: 06/26/2018