Patent Number: 6,293,027

Title: Distortion measurement and adjustment system and related method for its use

Abstract: A technique for measuring distortion in a structure of interest, such as a spacecraft antenna reflector (18), and optionally compensating for the distortion. A first set of targets (22) on the structure (18) is scanned by an attitude transfer system (24) to measure the angular location and range of each target relative to a reference point on another structure (12) having a frame of reference. The orientation of the structure of interest is them determined from the measured locations of the targets. A second set of targets (60 or 82) on the structure of interest is scanned by a figure sensing module (26) located at a reference point on the structure itself. From measured angular locations and ranges of the second set of targets, any shape distortion in the structure of interest can be determined, and distortion may be corrected with the use of actuators (98).

Inventors: Elliott; Lee E. (Torrance, CA), MacKay; Michael K. (Palos Verdes Estates, CA), Flannery; John V. (Redondo Beach, CA)

Assignee: TRW Inc.

International Classification: G01B 11/16 (20060101); G01B 11/00 (20060101); G01S 17/00 (20060101); G01S 17/46 (20060101); G01S 17/87 (20060101); G01S 17/42 (20060101); G01B 011/24 ()

Expiration Date: 09/25/2018