Patent Number: 6,294,774

Title: Scanning probe microscope having graphical information

Abstract: There is disclosed a scanning probe microscope, such as an atomic forcemicroscope or a friction force microscope, permitting an operator toeasily adjust the position on a photodiode hit by light. The microscopeincludes an optical detector having a light-sensitive portion that iscircular or polygonal and consists of a photodiode. The profile of thephotodiode or graphical information about the photodiode is stored inmemory. The photodiode is segmented into four elements. A calculator findsthe center of the light incident on the photodiode from the output signalsfrom the four elements. A picture of the photodiode is displayed on theviewing screen of a display unit according to the graphical informationabout the photodiode stored in memory. A marker indicating the incidentposition of the light is superimposed on the picture of the photodiodedisplayed on the viewing screen.

Inventors: Ito; Takashi (Tokyo, JP), Nakamoto; Keiichi (Tokyo, JP)

Assignee:

International Classification:

Expiration Date: 09/25/2013