Patent Number: 6,294,779

Title: Orthogonal ion sampling for APCI mass spectrometry

Abstract: A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.

Inventors: Apffel; James A. (Palo Alto, CA), Werlich; Mark H. (Santa Clara, CA), Bertsch; James L. (Palo Alto, CA), Goodley; Paul C. (Cupertino, CA)

Assignee: Agilent Technologies, Inc.

International Classification: G01N 30/00 (20060101); G01N 30/72 (20060101); H01J 49/04 (20060101); H01J 49/02 (20060101); H01J 049/26 ()

Expiration Date: 09/25/2018