Patent Number: 6,294,790

Title: Secondary ion generator detector for time-of-flight mass spectrometry

Abstract: An ion detector includes a secondary charged particle generator that generates secondary charged particles in response to primary ions that engage the secondary charged particle generator. The secondary charged particle generator has an electrostatic potential that repels the secondary charged particles toward an electro-emissive detector that generates electrons in response to primary ions and secondary charged particles that engage the electro-emissive detector The electro-emissive detector has a field that attracts the secondary charged particles. An anode is provided for detecting electrons generated by the electro-emissive detector and for generating a signal.

Inventors: Weinberger; Scot R. (Montara, CA)

Assignee: Ciphergen Biosystems, Inc.

International Classification: H01J 49/10 (20060101); H01J 49/40 (20060101); H01J 49/34 (20060101); G01K 001/08 (); H01J 003/14 (); H01J 003/26 ()

Expiration Date: 09/25/2018