Patent Number: 6,294,908

Title: Top and bottom access functional test fixture

Abstract: A computer system is provided for testing components within the system. A closely coupled dual-access fixture is used for electrically interfacing a first side and a second side of a PCB under test. The fixture has a first interface for electrically interfacing the fixture with a first set of test pads on the first side of the PCB under test. The fixture also includes a second interface for electrically interfacing the fixture with a second set of test pads on the side of the PCB under test opposite the first side. Both interfaces include an interface PCB (IPCB). Each IPCB has at least one connector corresponding to a connector on the PCB under test. Each of the connectors on the PCB under test has test pads on the side opposite the connector. Sets of test pins are used to electrically connect the connector of the PCB under test to the respective IPCB so that a PC card placed in the connector of the IPCB will interface with the PCB under test as if the PC card were placed in the connector of the PCB under test. This arrangement allows the test PC cards to remain in close proximity to the PCB under test and eliminates latencies and noise that can interfere with testing. Once interfaced with the fixtures, the PCB under test becomes an integral part of a test computer system so that the PCB under test can be tested under operating conditions.

Inventors: Belmore; Walter Joseph (Spring, TX), Vu; Dustin (Houston, TX)

Assignee: Compaq Computer Corporation

International Classification: G01R 31/28 (20060101); G01R 031/02 ()

Expiration Date: 09/25/2018