Patent Number: 6,294,911

Title: Measurement method of magnetization direction of magnetoresistive effect devices and measurement apparatus based on the method of TDK corporation

Abstract: A method of measuring magnetization direction of a MR device, includes a first step of obtaining both maximum electrical resistance values under positive and negative applied measurement magnetic fields onto the MR device biased by anti-ferromagnetic material, a second step of relatively rotating a basic axis of the MR device against a direction of the applied measurement magnetic field until both the maximum resistance values become comparatively the same, and a third step of obtaining a relative rotation angle between the basic axis of the MR device and the direction of the applied measurement magnetic field.

Inventors: Shimazawa; Koji (Tokyo, JP), Hachisuka; Nozomu (Tokyo, JP), Ohta; Manabu (Tokyo, JP), Sasaki; Tetsuro (Tokyo, JP), Araki; Satoru (Tokyo, JP)

Assignee: TDK Corporation

International Classification: G01R 33/09 (20060101); G01R 33/06 (20060101); G11B 5/00 (20060101); G11B 5/455 (20060101); G01R 033/09 ()

Expiration Date: 09/25/2018