Patent Number: 6,294,923

Title: Method and system for detecting faults utilizing an AC power supply

Abstract: A system and method for detecting a position of a short in a semiconductor device is disclosed. The semiconductor device includes a semiconductor die and a substrate. The method and system include supplying alternating power to the semiconductor device. The method and system further include sensing a plurality of synchronous temperature variations in proximity to a surface of the semiconductor die while power is supplied to the semiconductor die.

Inventors: Blish, II; Richard C. (Saratoga, CA), Black; J. Courtney (San Jose, CA), Massoodi; Mohammad (Campbell, CA)

Assignee: Advanced Micro Devices, Inc.

International Classification: G01R 31/28 (20060101); G01R 031/28 (); G01R 031/311 ()

Expiration Date: 09/25/2018