Patent Number: 6,294,949

Title: Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus

Abstract: A circuit includes a first current path formed by a resistance R2, a transistor Q2, a transistor Q5 and a resistance R5. When an input signal A is low, a current i4 flows through the first circuit and the circuit outputs a shift voltage shifted from a constant voltage. When the input signal is high, the circuit directly outputs the constant voltage VH. The circuit further includes a second current path formed by a resistance R3 and a transistor Q3. By running a simulation current through the second current path, the shift voltage is monitored by a comparator OP1, and the current i4 is adjusted.

Inventors: Kojima; Shoji (Tokyo, JP), Sekino; Takashi (Tokyo, JP)

Assignee: Advantest Corporation

International Classification: G01R 31/28 (20060101); G01R 31/3193 (20060101); G01R 31/317 (20060101); G01R 31/319 (20060101); G01R 31/3185 (20060101); H03K 5/22 (20060101); H03F 3/72 (20060101); H03K 5/24 (20060101); G05F 001/10 (); H03K 005/22 ()

Expiration Date: 09/25/2018