Patent Number: 6,295,083

Title: High precision image alignment detection

Abstract: High precision image alignment detection uses an iterative part pixel shift detection algorithm to accurately determine the displacement of a received image with respect to a reference image. An alignment pattern is inserted into the original image and a portion of the alignment pattern, such as a single line, also is stored as a reference image. Using cross-correlation the received image is compared with the reference image to locate the alignment pattern, and selected portions of the received image alignment pattern are then used in conjunction with the reference image to determine the total pixel shift of the received image. An integer pixel shift is determined by cross-correlation of the received alignment pattern with the reference image. Using the integer pixel shift to identify a starting point, data is extracted from the received alignment pattern about a specific feature and a part pixel shift is measured. The received alignment pattern is then shifted by the part pixel shift, the data is again extracted and an additional part pixel shift is measured. These steps are iterated, using the sum of all prior part pixel shifts for each subsequent shift. At completion the total of the integer pixel shift value and all the part pixel shift values determines the pixel shift required for registration of the received image vis a vis the original image.

Inventors: Kuhn; Alexander (Hillsboro, OR)

Assignee: Tektronix, Inc.

International Classification: G06T 3/00 (20060101); H04N 17/00 (20060101); H04N 017/00 ()

Expiration Date: 09/25/2018