Patent Number: 6,295,129

Title: Arrangement and method for marking defects

Abstract: A method and device for marking defects in or on a substantially planar strip (70, 170), preferably a strip of polymeric film. The defect is marked by means of firstly illuminating the width across the strip (70, 170) by means of a light source (90, 190) and detecting defects in or on the strip (70, 170) by means of a detector (10, 300). The strip (70, 170) is placed in a plane in connection with the light source (90, 190) and wherein the incident light is reproduced on the detector (10, 300). Thereafter, the defect is marked by means of a marker (200) which is placed in connection with the defect. The marker (200) is placed on a label (62, 162), which is attached onto the strip (70, 170).

Inventors: Bjork; Svante (Kungsbacka, SE)

Assignee: Svante Bjork AB

International Classification: G01N 21/88 (20060101); G01N 21/89 (20060101); G01N 021/89 ()

Expiration Date: 09/25/2018