Patent Number: 6,297,650

Title: Electrooptic probe

Abstract: The present invention relates to an electrooptic probe that couples an electrical field generated by a measured signal and an electrooptic crystal, makes light incident on this electrooptic crystal, and measures the waveform of the measured signal by the state of the polarization of the incident light. Here, in the probe body 22, the probe head 23 and the supporting member 44 positioned between the end terminal 22a and the part that encloses the laser diode 25 and the photodiodes 38 and 39 are formed by an insulating body (polyacetal resin). Furthermore, the photodiodes 38 and 39 and the laser diode 25 are covered by electromagnetic shield members 41 and 42 that are separated from each other.

Inventors: Ito; Akishige (Tokyo, JP), Ohta; Katsushi (Tokyo, JP), Yagi; Toshiyuki (Tokyo, JP), Shinagawa; Mitsuru (Isehara, JP), Nagatsuma; Tadao (Sagamihara, JP), Yamada; Junzo (Ebina, JP)

Assignee: Ando Electric Co., LTD

International Classification: G01R 1/067 (20060101); G01R 1/07 (20060101); G01R 031/308 ()

Expiration Date: 10/02/2018