Patent Number: 6,297,651

Title: Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module

Abstract: Disclosed herein is an electro-optic sampling probe in which the quantity of light incident on the electro-optic sampling system module can be adjusted. The probe includes an electro-optic element that has a reflective face, an optical system for transmitting a laser beam received from an external source and an electro-optic sampling optical system module as well as unit for attenuating the quantity of light of the laser beam that is received by the optical system.

Inventors: Akikuni; Fumio (Tokyo, JP), Ohta; Katsushi (Tokyo, JP), Nagatsuma; Tadao (Sagamihara, JP), Shinagawa; Mitsuru (Isehara, JP), Yamada; Junzo (Ebina, JP)

Assignee: Ando Electric Co., Ltd.

International Classification: G01R 1/067 (20060101); G01R 1/07 (20060101); G01R 31/28 (20060101); G01R 31/311 (20060101); G01R 031/308 ()

Expiration Date: 10/02/2018