Patent Number: 6,297,661

Title: Semiconductor switch fault detection

Abstract: A system and method for detecting various fault conditions in semiconductor devices. A variable voltage reference is compared to the voltage output of the device during device turn-on to detect circuit fault conditions. The fault condition is then communicated to a controller.

Inventors: Chen; Chingchi (Ann Arbor, MI), Sankaran; Venkateswara Anand (Farmington Hills, MI)

Assignee: Ford Global Technologies, Inc.

International Classification: G01R 19/165 (20060101); G01R 031/26 ()

Expiration Date: 10/02/2018