Patent Number: 6,297,662

Title: Semiconductor device

Abstract: A semiconductor device in which outputs of flip-flops are not stopped even if one of the logic blocks of a test circuit is not activated. A burn-in test circuit has an XOR circuit by which, when an output signal and a burn-in input signal of one logic block is supplied, the other logic blocks are activated.

Inventors: Okitaka; Takenori (Tokyo, JP)

Assignee: Mitsubishi Denki Kabushiki Kaisha

International Classification: G01R 31/28 (20060101); H03K 019/00 ()

Expiration Date: 10/02/2018