Patent Number: 6,297,997

Title: Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array

Abstract: In a semiconductor device including banks A and B, testing and redundancy analysis of the bank B are first carried out by using a conventional tester, and redundancy replacement is carried out. Then, the bank A is tested by a BIST circuit and the test result of each bit is written to the bank B. By using the bank B as a memory for defect analysis, a tester connected to the semiconductor device while testing the bank A does not need a large capacity analysis memory. Thus, an inexpensive redundancy analysis system can be provided.

Inventors: Ohtani; Jun (Hyogo, JP), Hamada; Mitsuhiro (Hyogo, JP)

Assignee: Mitsubishi Denki Kabushiki Kaisha

International Classification: G11C 29/44 (20060101); G11C 29/04 (20060101); G11C 007/00 ()

Expiration Date: 10/02/2018