Patent Number: 6,298,116

Title: X-ray examination apparatus

Abstract: An X-ray examination apparatus is provided with a DC voltage source which is to be connected to a maines voltage and whereto there are connected an accumulator with a charging circuit for this the accumulator as well as a high voltage generator for an X-ray tube. The accumulator is charge in a standby mode; the accumulator can be discharged via the high voltage generator. There is provided a power gate circuit via which power up to a maximum value can be drawn from the mains, the accumulator being chargeable for as long as this maximum value has not yet been reached; when a power beyond said maximum value is required, the surplus beyond this maximum value is delivered by the accumulator via said power gate circuit.

Inventors: Methley; Peter Brian (Eindhoven, NL), Van Der Heijden; Theodorus Antonius (Eindhoven, NL)

Assignee: U.S. Philips Corporation

International Classification: H02J 7/34 (20060101); H05G 1/12 (20060101); H05G 1/00 (20060101); H05G 001/06 ()

Expiration Date: 10/02/2018