Patent Number:
6,298,116
Title:
X-ray examination apparatus
Abstract:
An X-ray examination apparatus is provided with a DC voltage source which is to be connected to a maines voltage and whereto there are connected an accumulator with a charging circuit for this the accumulator as well as a high voltage generator for an X-ray tube. The accumulator is charge in a standby mode; the accumulator can be discharged via the high voltage generator. There is provided a power gate circuit via which power up to a maximum value can be drawn from the mains, the accumulator being chargeable for as long as this maximum value has not yet been reached; when a power beyond said maximum value is required, the surplus beyond this maximum value is delivered by the accumulator via said power gate circuit.
Inventors:
Methley; Peter Brian (Eindhoven, NL), Van Der Heijden; Theodorus Antonius (Eindhoven, NL)
Assignee:
U.S. Philips Corporation
International Classification:
H02J 7/34 (20060101); H05G 1/12 (20060101); H05G 1/00 (20060101); H05G 001/06 ()
Expiration Date:
10/02/2018