Patent Number: 6,298,315

Title: Method and apparatus for analyzing measurements

Abstract: A method, apparatus, and article of manufacture for analyzing measurements.The invention provides a method for separating and analyzing thecomponents of a distribution, such as deterministic and random components.The method performs the steps of collecting data from a measurementapparatus, constructing a histogram based on the data such that thehistogram defines a distribution, fitting tails regions whereindeterministic and random components and associated statistical confidencelevels are estimated.

Inventors: Li; Peng (Fremont, CA), Jessen; Ross Adam (Savage, MN), Wilstrup; Jan Brian (Mounds View, MN), Petrich; Dennis (San Jose, CA)


International Classification:

Expiration Date: 10/02/2013