Patent Number: 6,298,450

Title: Detecting states of signals

Abstract: A time delay from a triggering event to switching of an output signal in a microelectronic device can be adjusted to compensate for various characteristics of the electronic device. The characteristics include temperature, voltage, and manufacturing process conditions. The time delay is adjusted using a variable delay circuit having multiple delay cells that are selectively coupled to control the time delay. The conditions of the electronic device are detected using a process sensor, which includes an oscillator having a frequency that is sensitive to variations in the conditions.

Inventors: Liu; Jonathan H. (Folsom, CA), Allen; Michael J. (Rescue, CA), Conary; James W. (Aloha, OR), DiMarco; David P. (Hillsboro, OR), Miller; Jeffrey L. (Vancouver, WA)

Assignee: Intel Corporation

International Classification: G06F 1/04 (20060101); G06F 1/14 (20060101); H03K 023/00 ()

Expiration Date: 10/02/2018