Patent Number: 6,307,912

Title: Methods and apparatus for optimizing CT image quality with optimized data acquisition

Abstract: A method is described for optimizing signal-to-noise performance of an imaging system, including the steps of scout-scanning an object to obtain scout scan data; determining a plurality of normalized x-ray input signal factors using the scout scan data; using the normalized x-ray input signal factors to determine at least one system input signal; selecting at least one gain for the object scan using the system input signal; and applying the selected gain corresponding to the system input signal in the object scan.

Inventors: He; Hui David (Waukesha, WI), Toth; Thomas L. (Brookfield, WI)

Assignee: General Electric Company

International Classification: A61B 6/03 (20060101); G01N 023/00 ()

Expiration Date: 10/23/2018