Patent Number: 6,307,918

Title: Position dependent beam quality x-ray filtration

Abstract: The present invention, in one form, is an imaging system which, in one embodiment, utilizes a filter assembly including a plurality of filter portions for altering the intensity and quality of an x-ray beam. Specifically, in one embodiment, by positioning the filter assembly so that the x-ray beam is filtered by the first portion of the filter assembly, the x-ray beam is altered to perform a body portion scan. By positioning the filter assembly to the second portion, the x-ray beam is altered to perform a head portion scan.

Inventors: Toth; Thomas L. (Brookfield, WI), Vara; Carmine F. (New Berlin, WI), Hampel; Willi W. (St. Francis, WI)

Assignee: General Electric Company

International Classification: A61B 6/03 (20060101); G21K 1/10 (20060101); G21K 1/00 (20060101); G21K 003/00 ()

Expiration Date: 10/23/2018