Patent Number: 6,309,809

Title: Multi-layer integrated imaging/image recording process with improved image tolerances

Abstract: A pattern is formed on a substrate by the process of providing a substrate having a surface with previously patterned features having a non-uniform electromagnetic reflectivity, applying a second image recording material to the surface, employing the features with a non-uniform physical property of reflectivity to delineate a desired pattern in the second image recording material and applying electromagnetic energy to take advantage of the reflectivity features to provide variable processing of the second material.

Inventors: Starikov; Alexander (Fishkill, NY), Goodman; Douglas Seymore (Sudbury, MA)

Assignee: International Business Machines Corporation

International Classification: G03F 7/09 (20060101); G03F 7/00 (20060101); G03C 005/10 (); G03C 005/56 ()

Expiration Date: 10/30/2018