Patent Number: 6,310,646

Title: Method and apparatus for measuring a radio frequency signal having program information and control information

Abstract: Disclosed are method and apparatus which measure signal level of an RF signal. The measured RF signal includes a baseband signal modulated onto a first carrier signal having a first frequency and the baseband signal includes program information and control information. The method and apparatus digitize the RF signal which includes the baseband control information and determine a signal level measurement from the baseband control information in the digitized RF signal. Furthermore, method and apparatus are disclosed which determine from the digitized RF signal whether a tagging signal is present in the RF signal.

Inventors: Shi; Pingnan (Indianapolis, IN), Bowyer; Andrew E. (Indianapolis, IN), Zhang; Qin (Bensalem, PA)

Assignee: Wavetek Corporation

International Classification: H04B 17/00 (20060101); H04N 17/00 (20060101); H04N 5/44 (20060101); H04N 5/455 (20060101); H04N 017/02 (); H04N 005/455 (); G01R 025/02 (); H04B 017/00 ()

Expiration Date: 10/30/2018