Patent Number: 6,310,935

Title: Fluorescent x-ray analyzer

Abstract: A fluorescent x-ray analyzer has a light-dispersing crystal and a detector which are rotatable while maintaining a specified angular relationship between them such that fluorescent x-rays from a sample are scanned. A first-order profile and a higher-order profile showing x-ray intensities against scan angle are produced from detection signals from the detector respectively within a different specified range of wavelengths. Data related to ratios between preliminarily measured peak intensities of diffracted beams of first-order and higher-order obtained from a plurality of elements are stored and used to identify peaks in these profiles, if there is a possibility of a peak formed by a first-order spectrum of one element and a higher-order spectrum of another element overlapping each other and the nature and extent of contributions to the peaks in the profiles from the first-order and higher-order spectra are determined.

Inventors: Kuwabara; Shoji (Osaka, JP)

Assignee: Shimadzu Corporation

International Classification: G01N 23/223 (20060101); G01N 23/22 (20060101); G01N 023/223 ()

Expiration Date: 10/30/2018