Patent Number: 6,332,683

Title: Fundus examination apparatus

Abstract: Fundus examination is effected by the steps of irradiating the fundus of an examined eye with a measuring beam through a deflector, irradiating the fundus of the eye with a tracking beam through the deflector to thereby obtain tracking information, and controlling the deflector on the basis of the tracking information and executing tracking, calculating a position at which the reliability of a signal obtained by a light receiving system is relatively improved during the tracking, and controlling the deflector so that the measuring beam may be irradiated to this position; and frequency-analyzing the signal obtained by the light receiving system and calculating the velocity of blood flow. The aforementioned reliability is evaluated by means of the SN ratio and quality value of the signal.

Inventors: Ono; Shigeaki (Utsunomiya, JP), Tanaka; Shinya (Tokyo, JP), Okumura; Toshiaki (Tokyo, JP)

Assignee: Canon Kabushiki Kaisha

International Classification: A61B 3/12 (20060101); A61B 003/14 ()

Expiration Date: 12/25/2018