Patent Number: 6,396,292

Title: Test carrier with decoupling capacitors for testing semiconductorcomponents

Abstract: A test carrier for testing a semiconductor component includes at least onedecoupling capacitor for reducing parasitic inductance and noise in testsignals transmitted to the component. The carrier includes a base, aninterconnect for making temporary electrical connections with thecomponent, and a force applying mechanism for biasing the componentagainst the interconnect. The decoupling capacitor can be mounted to thebase, or to the interconnect, with electrodes of the capacitor containedin power and ground paths to the component. A test method includes thesteps of providing the carrier with the decoupling capacitor, assemblingthe component in the carrier, and transmitting test signals through thedecoupling capacitor to the component. A test system includes the testcarrier, a test apparatus such as a test board, and test circuitry forgenerating and analyzing test signals.

Inventors: Hembree; David R. (Boise, ID), Akram; Salman (Boise, ID)


International Classification: G01R 31/08 (20060101); G01R 031/02 (); G01R 031/26 ()

Expiration Date: 05/28/2014