Patent Number: 6,401,224

Title: Integrated circuit and method for testing it

Abstract: A test method suitable for testing at least one integrated circuit which, on a main area, has contact areas that serve to transfer signals during a first operating mode of the circuit. Only some of the contact areas are contact-connected to test contacts of a test apparatus and the circuit is put into a second operating mode in which the signals which are transferred via at least one of the non-contact-connected contact areas in the first operating mode are transferred via at least one of the contact-connected contact areas.

Inventors: Schoniger; Sabine (Munchen, DE), Schrogmeier; Peter (Munchen, DE), Hein; Thomas (Munchen, DE), Dietrich; Stefan (Turkenfeld, DE)

Assignee: Infineon Technologies AG

International Classification: G01R 31/28 (20060101); G01R 31/3185 (20060101); G01R 031/28 (); G01R 031/02 (); G11C 029/00 ()

Expiration Date: 06/04/2019