Patent Number: 6,480,416

Title: Storage device counting error correction

Abstract: A semiconductor storage device that determines the cause of an error at the time of the error correction of data read out from a non-volatile semiconductor memory, on the basis of a previously recorded error correction count, and selects a data refresh processing or a substitute processing to perform. When the error is detected, the corrected data is rewritten back for preventing reoccurrence of error due to accidental cause. If it is determined that the reoccurrence frequency of the error is high and the error is due to degradation of the storage medium, based on the error correction count, the substitute processing is performed.

Inventors: Katayama; Kunihiro (Chigasaki, JP), Tamura; Takayuki (Yokohama, JP), Jono; Yusuke (Higashiyamato, JP), Kanamori; Motoki (Tachikawa, JP), Shikata; Atsushi (Higashimurayama, JP)

Assignee: Hitachi, Ltd.

International Classification: G06F 11/10 (20060101); G06F 11/20 (20060101); G11C 016/06 ()

Expiration Date: 11/12/2019