Patent Number: 6,486,676

Title: Reflection measurement method and apparatus for devices that are accessed through dispersive elements

Abstract: A reflection measurement method and apparatus measures reflection characteristics of a device under test (DUT) when access to the DUT is through a dispersive element. The method and apparatus measure a composite reflection response of a network that includes the DUT and the dispersive element coupled to the DUT via a transmission line. A reflection response of the dispersive element is isolated from a remainder of the composite reflection response of the network. A set of transmission parameters for the dispersive element is generated from the isolated reflection response of the dispersive element and is then applied to the remainder of the composite reflection response of the network to extract the reflection characteristic of the DUT.

Inventors: Noe; Terrence R. (Sebastopol, CA)

Assignee: Agilent Technologies, Inc.

International Classification: G01R 31/11 (20060101); G01R 31/08 (20060101); G01R 031/11 (); G01R 031/08 ()

Expiration Date: 11/26/2011