Patent Number: 6,490,336

Title: Phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function in an X-ray computed tomography apparatus

Abstract: A phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function in an X-ray computed tomography apparatus contains a foil of a material that highly attenuates X-radiation that is arranged parallel to the image plane of the X-ray computed tomography apparatus given employment of the phantom and which had an axial expanse that is small compared to the thinnest slice to be measured. The expanse of the foil in the direction of the image plane is on the order of magnitude of a few millimeters.

Inventors: Suess; Christoph (Erlangen, DE), Kalender; Willi (Moehrendorf, DE)

Assignee: Siemens Aktiengesellschaft

International Classification: A61B 6/00 (20060101); A61B 6/03 (20060101); A61B 006/00 ()

Expiration Date: 12/03/2011