Patent Number: 6,515,486

Title: Method and structure to determine low threshold voltage and high threshold voltage

Abstract: A method is provided for quickly determining low threshold voltages and high threshold voltages of a test circuit. Specifically, a transformed voltage transfer curve for the test circuit is generated. The maximum and minimum points of the transfer circuit are determined to calculate transformed voltage threshold values. The transformed voltage threshold are transformed to find the desired threshold voltages.

Inventors: Nguyen; Andy T. (San Jose, CA)

Assignee: Xilinx, Inc.

International Classification: G01R 31/28 (20060101); G01R 31/30 (20060101); G01R 027/28 (); G01R 031/26 (); G01D 003/02 (); G06F 017/50 ()

Expiration Date: 02/04/2020