Patent Number: 6,528,993

Title: Magneto-optical microscope magnetometer

Abstract: A magneto-optical microscope magnetometer capable of simultaneouslymeasuring a hysteresis loop and activation magnetic moment of asubmicrometer-scale local area (about 0.3.times.0.3 .mu.m). Anelectromagnet capable of applying a magnetic field to a magnetic materialis attached to a polarizing optical microscope capable of observing amagnetized state of the magnetic material, such that images of themicroscope varying with the strength of the applied magnetic field aregrabbed in real time by a charge coupled device camera and then analyzed.The magneto-optical microscope magnetometer can measure a hysteresis loopand activation magnetic moment in a submicrometer-scale local areaobserved by the polarizing optical microscope. Further, themagneto-optical microscope magnetometer can measure hysteresis loops andactivation magnetic moments simultaneously with respect to all CCD pixelsof the camera and observe coercivity and activation magnetic momentdistributions of the entire magnetic material.

Inventors: Shin; Sung Chul (Taejon-si, KR), Choe; Sug Bong (Taejon-si, KR)

Assignee:

International Classification: G02B 21/00 (20060101); G01R 33/032 (20060101); G01R 033/032 (); G01R 033/12 (); G02B 027/28 ()

Expiration Date: 03/02015