Patent Number: 6,529,011

Title: Method and apparatus for inspecting electronic components

Abstract: An inspection apparatus and inspection method for assuring a contact between measuring terminals and external electrodes of a discrete electronic component without damaging the external electrodes. The measuring terminals are pressed into contact with the external electrodes of the discrete electronic component. An electrical signal source applies an electrical signal between the measuring terminals to break insulation layers of the measuring terminals and the external electrodes. With the insulation layers cleaned, the contact resistance between the measuring terminals and the external electrodes is reduced, and a conduction therebetween is established. After the cleaning of the insulation layers, a measuring instrument permits a measurement signal to flow to the electronic component with the measuring terminals left pressed into contact with the external electrodes. The characteristics of the electronic component are inspected based on a signal flowing through the electronic component.

Inventors: Okubo; Hiroshi (Takefu, JP)

Assignee: Murata Manufacturing Co., Ltd.

International Classification: G01R 31/01 (20060101); H01H 031/02 ()

Expiration Date: 03/04/2020