Patent Number: 6,794,679

Title: Semiconductor device that can measure timing difference between input and output signals

Abstract: A semiconductor device includes an internal circuit carrying out a predetermined process in accordance with an input signal, and a comparison circuit comparing the time required for an output signal in accordance with a predetermined process to be output and an input signal propagation time of an electric line having a line length adjusted to transmit a signal in a desired time

Inventors: Niiro; Mitsutaka (Hyogo, JP)

Assignee: Renesas Technology Corp.

International Classification: G01R 31/28 (20060101); G01R 31/30 (20060101); G01R 31/317 (20060101); G11C 29/02 (20060101); H01L 023/58 ()

Expiration Date: 09/21/2021