Patent Number: 6,801,042

Title: Calibration method and apparatus for signal analysis device

Abstract: A method and apparatus for calibrating at least signal probes associated with a signal analysis device by storing existing input channel parameters, performing appropriate calibration procedures and restoring input channel operational parameters.

Inventors: Mc Pherson; Mark E. (Beaveton, OR), Waldo; Gary J. (Hillsboro, OR), Eagle; Louis R. (Portland, OR), Running; Leif X. (Portland, OR), Johnson; Gary M. (Hillsboro, OR), Azinger; Frederick A. (Portland, OR), Fitzsimmons; Lynne A. (Portland, OR), Sullivan; Steve K. (Beaverton, OR)

Assignee: Tektronix, Inc.

International Classification: G01R 35/00 (20060101); G01R 35/02 (20060101); G01R 035/00 (); G01D 018/00 ()

Expiration Date: 10/05/2021