Patent Number: 7,042,547

Title: Method of repairing pit defect and salient defect of electrode pattern

Abstract: An inspection process is performed to determine defects of an electrode pattern. A first repairing process is performed to fill the pit part, and a second repairing process is performed to remove the salient part. The first repairing process utilizes a conductive paste to fill the pit part of the electrodes, and the second repairing process utilizes a laser beam to remove the salient part of the electrode pattern so that the electrodes can discharge normally.

Inventors: Wu; Yi-Jen (Tao-Yuan Hsien, TW)

Assignee: AU Optronics Corp.

International Classification: G02F 1/1337 (20060101); G02F 1/133 (20060101)

Expiration Date: 5/09/02018