Patent Number: 7,042,556

Title: Device and nondestructive method to determine subsurface micro-structure in dense materials

Abstract: A method and a device to detect subsurface three-dimensional micro-structure in a sample by illuminating the sample with light of a given polarization and detecting light emanating from the sample that has a different direction of polarization by means of a confocal optical system.

Inventors: Sun; Jiangang (Westmont, IL)

Assignee: The United States of America as represented by the United States Department of Energy

International Classification: G01C 3/08 (20060101)

Expiration Date: 5/09/02018