Patent Number: 7,042,570

Title: Porous thin film time-varying reflectivity analysis of samples

Abstract: A method for analyzing gaseous or liquid samples is provided. Samples are interacted with pores of a porous thin film. A time-varying response of reflectivity is obtained from the surface of the porous thin film during the interaction. One or more analytes forming the sample or a part of the sample are identified based upon the time-varying response.

Inventors: Sailor; Michael J. (La Jolla, CA), Letant; Sonia (Livermore, CA)

Assignee: The Regents of the University of California

International Classification: G01N 21/55 (20060101); C12M 1/34 (20060101)

Expiration Date: 5/09/02018