Patent Number: 7,043,391

Title: User interface for semiconductor evaluation device

Abstract: The present invention is a user interface of the semiconductor evaluation device, which evaluates the characteristics of the semiconductor elements on a wafer. This user interface provides means on which a setting window is displayed in order to conduct the setting of the measurement conditions to each setting object having a hierarchical relation, means on which a main setting window is displayed to manage the setting window, means to save in a file the measurement conditions set in the setting window, and means to load the measurement conditions that are set in the first setting window for the first setting object and saved in a file for the second setting window to the second setting object, which is located at higher level than the first setting window and is able to set up selectively to the user the measurement conditions loaded in the second setting window. As a result, the user becomes set up systematically the measurement conditions necessary for conducting characteristics evaluation of the semiconductor elements.

Inventors: Miyazaki; Shuji (Kanagawa 225-0005, JP)

Assignee:

International Classification: G06F 19/00 (20060101)

Expiration Date: 5/09/02018