Patent Number: 7,043,403

Title: Fault detection and classification based on calculating distances between data points

Abstract: A method and apparatus is provided for fault detection and classification based on calculating distances between data points. The method comprises receiving a data sample representative of measurements of one or more variables associated with a process operation, determining a distance between the data sample and one or more data points of a history data of the process operation and detecting a fault associated with the process operation based on the distance between the data sample and the one or more data points of the history data.

Inventors: Wang; Jin (Austin, TX), Cherry; Gregory A. (Austin, TX)

Assignee: Advanced Micro Devices, Inc.

International Classification: G06F 19/00 (20060101)

Expiration Date: 5/09/02018