Patent Number: 7,047,149

Title: Optical measurement instrument and optical measurement method

Abstract: An optical measurement system for optically measuring a body to be inspected and obtaining an image of a desired item based on information obtained by the measurement includes means for displaying a number of measurement points, means for indicating a light irradiation position and a light detecting position and means for displaying a measurement position and a state of allocating a number to the measurement position. The system further includes means for displaying measuring time sequence data, means for setting a condition of acquiring data, means for displaying a status of acquiring the data, means for instructing control of measurement and means for marking a mark at a position measuring time sequence data.

Inventors: Maki; Atsushi (Hachioji, JP), Yamashita; Yuuichi (Kawagoe, JP), Yamamoto; Tsuyoshi (Hatoyama, JP), Koizumi; Hideaki (Tokyo, JP)

Assignee: Hitachi, Ltd.

International Classification: G01C 17/00 (20060101)

Expiration Date: 5/16/02018