Patent Number: 7,084,975

Title: Particle diameter distribution measurement apparatus and method of calibration

Abstract: A particle diameter distribution measurement apparatus and method includes a sample cell that can be irradiated by a source of light. A plurality of detectors are positioned operatively adjacent to the sample cell to measure light interacting with a specimen in the sample cell. A storage unit stores values representative of outputs of the detectors for a plurality of standard particle sizes. The representation outputs extend across a range of detection for a plurality of detectors. A controller unit can perform a calibration based on the stored values and an actual measurement of one or more standard particle sizes that has the capability of providing a range of detection that will be inclusive of a standard particle size that is not available for measurement.

Inventors: Ikeda; Hideyuki (Kyoto, JP), Nakano; Yuki (Kyoto, JP)

Assignee: Horiba, Ltd.

International Classification: G01N 15/02 (20060101)

Expiration Date: 8/01/02018