Patent Number: 7,085,094

Title: Interleaved repeatable runout correction for data storage device

Abstract: A reduction in computational load associated with correction of repeatable runout is provided. Rather than performing DFT for each analyzed frequency at each interrupt, at least some frequencies are not analyzed in the same interrupt period. DFTs for different frequencies may be staggered or interleaved. DFTs for different frequencies may be performed at different rates, preferably, using higher rates for higher frequencies.

Inventors: Heimbaugh; Mark (Pleasanton, CA), Sun; Yu (Fremont, CA)

Assignee: Maxtor Corporation

International Classification: G11B 5/596 (20060101)

Expiration Date: 8/01/02018