Patent Number: 7,085,630

Title: Method and apparatus for predicting runway overrun

Abstract: A critical point on a runway indicates a point at which an aircraft may experience a runway overrun if landing beyond the critical point. A path projection is extended from the aircraft at a descent slope angle to determine whether the aircraft will land beyond the critical point at the current descent slope. Timely alerts may be provided by accounting for the time required to announce a distance value, and the distance traveled during the announcement.

Inventors: Ryan; Dean E. (Dublin, OH), Brodegard; William C. (Delaware, OH)

Assignee: Avidyne Corporation

International Classification: G06F 19/00 (20060101)

Expiration Date: 8/01/02018