Patent Number: 7,085,989

Title: Optimized testing of bit fields

Abstract: A method for comparing bit field contents for bit fields comprising less than a full complement of the source is provided. The method includes creating a mask covering the bit field in the source, setting bit positions within the mask that are outside the bit field in the source to predetermined values, combining the source against the mask to form an intermediate result, and comparing bits in the intermediate result to provide a final result. Alternately, the method may form a mask, combining the bit field with a comparison value to form an intermediate value, and perform a combined function using the mask to select bits from the intermediate value, or fixed zero or one values, and comparing this result with zero.

Inventors: Jarp; Sverre (Cheserex, CH), Morris; Dale (Steamboat Springs, CO)

Assignee: Hewlett-Packard Development Company, L.P.

International Classification: H03M 13/00 (20060101)

Expiration Date: 8/01/02018