Patent Number: 7,088,091

Title: Testing a multi-channel device

Abstract: In one embodiment, a method includes routing first test data from a first channel of a device to a second channel of the device, and outputting the first test data from the second channel. The device, in one embodiment, may be a mixed signal device and the test data may be alternating current test data.

Inventors: Abdennadher; Salem (Sacramento, CA)

Assignee: Intel Corporation

International Classification: G01R 31/28 (20060101)

Expiration Date: 8/08/02018