Patent Number: 7,089,144

Title: Determining impact of test operations at a product assembly and test facility with repairable product

Abstract: A method and apparatus for establishing an average test time (T.sub.A) include determining a first time interval (T.sub.G) nominally associated with non-failing testing of a unit under test (UUT), and determining a second time interval (T.sub.PR) nominally associated with troubleshooting and repairing a failed unit under test. Additionally, a percent yield (Y) nominally associated with a proportion of non-failing units under test is determined. The average test time is a sum of the first time interval associated with the non-failing testing of the UUT, and a ratio of the second time interval associated with troubleshooting and repair of a failed UUT with respect to the yield.

Inventors: Mosher; James H. (Pickerington, OH)

Assignee: Lucent Technologies Inc.

International Classification: G06F 19/00 (20060101)

Expiration Date: 8/08/02018