Patent Number: 7,102,358

Title: Overvoltage detection apparatus, method, and system

Abstract: A transistor may have degraded characteristics because of an overvoltage condition. The degraded characteristics may be sensed to determine that the transistor has previously been subjected to an overvoltage condition.

Inventors: Keshavarzi; Ali (Portland, OR), Paillet; Fabrice (Hillsboro, OR), Khellah; Muhammad M (Tigard, OR), Somasekhar; Dinesh (Portland, OR), Ye; Yibin (Portland, OR), Tang; Stephen H (Pleasanton, CA), Alavi; Mohsen (Portland, OR), De; Vivek K (Beaverton, OR)

Assignee: Intel Corporation

International Classification: G01R 31/26 (20060101)

Expiration Date: 9/05/02018